Alignment mark searching method, display substrate and display apparatus

Abstract

An alignment mark searching method is for searching an alignment mark on a base substrate, a first positioning line segment is formed in a dummy region of the base substrate, and a straight line where the first positioning line segment is positioned running through the alignment mark. The method includes: acquiring theoretical coordinates of the alignment mark; moving a detection system view field to a target position with the theoretical coordinates as a target; moving the detection system view field from the target position in a direction perpendicular to the first positioning line segment until the first positioning line segment appears in the detection system view field; and moving the detection system view field from the position of the first positioning line segment in a length direction of the first positioning line segment until the alignment mark appears in the detection system view field. The method achieves an effect that the alignment mark can be simply, conveniently and rapidly searched. A display substrate and a display apparatus are further disclosed.