The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Oct. 12, 2017
Olympus Corporation, Tokyo, JP;
Yoko Abe, Hino, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A microscopy system includes: an image acquisition unit configured to acquire slice images generated by capturing an object image while shifting a focal position along an optical axis of an observation optical system included in a microscope; an image shift processing configured to relatively shift, with respect to one slice image among the slice images, another slice image in a plane including the one slice image; an all-in-focus image generation unit configured to generate all-in-focus images by combining the one slice image and the other slice image relatively shifted with respect to the one slice image under conditions in which shift amounts of the other slice image with respect to the one slice image are different; and a display unit configured to display the all-in-focus images.