The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Jul. 09, 2014
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventor:

Hans-Peter Fautz, Forchheim, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/565 (2006.01); G01R 33/3415 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5608 (2013.01); G01R 33/5659 (2013.01); G01R 33/3415 (2013.01); G01R 33/56563 (2013.01);
Abstract

A magnetic resonance (MR) tomography apparatus has an array composed of a number n of single coils Eto acquire reception signals I. The tomography apparatus is operated by a method that includes the following steps. For each single coil E, a processor determines, or is provided with, an individual reception sensitivity profile in positional space r B1(r). An examination subject introduced into the MR tomography apparatus is scanned to acquire reception signals I(k) in the frequency domain with the n reception coils E. Fourier-transformed signals IF(r) are determined from the reception signals I(k). Complexly corrected signals ĨF(r) are determined on the basis of the signals IF(r) and the individual reception sensitivity profiles B1(r). A sum signal MR(r) is determined by complex addition of the corrected signals ĨF(r). Image data of the examination subject are reconstructed on the basis of the sum signal MR(r).


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