The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Apr. 12, 2017
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Ralf Ladebeck, Erlangen, DE;

Daniel Niederloehner, Erlangen, DE;

Johann Sukkau, Herzogenaurach, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/3875 (2006.01); G01R 33/44 (2006.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01R 33/3875 (2013.01); G01R 33/443 (2013.01); G01R 33/5608 (2013.01);
Abstract

In a method and magnetic resonance apparatus for determining a shim setting in order to increase a homogeneity of the basic magnetic field of the scanner of the apparatus by operating a shim element, information is obtained concerning the dependence of an induced field of the shim element on a set shim setting. A first field map is recorded and a first shim setting for the shim element is determined based on the first field map. A second field map is recorded while the shim element is driven with the first shim setting. A field induced by the shim element by the first shim setting is determined based on the first field map and the second field map. A second shim setting for the shim element is determined based on the determined induced field and the acquired information.


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