The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

May. 28, 2015
Applicant:

Keysight Technologies, Inc., Minneapolis, MN (US);

Inventor:

Jonathan Helfman, Half Moon Bay, CA (US);

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 35/005 (2013.01);
Abstract

A method of operating a data processing system to generate a diagram indicative of an experimental setup includes a device to be tested (DUT) and a plurality of test instruments is disclosed. The method includes detecting a first test instrument that is connected to the data processing system and determining connection points to the first test instrument. A script that specifies tests for the DUT using the plurality of test instruments and includes instructions specifying measurements to be made by the first test instrument is examined. A first connection between the DUT and the first test instrument is determined. An initial diagram on a display controlled by the data processing system is generated. The initial diagram includes a first node representing the first test instrument, a second node representing the DUT and a line representing the first connection between the first and second nodes.


Find Patent Forward Citations

Loading…