The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

May. 11, 2018
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Ali Al-Yousef, Dhahran, SA;

Subhash Ayirala, Katy, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); G01N 33/28 (2006.01); G01N 11/02 (2006.01); G01N 15/08 (2006.01); G01N 13/02 (2006.01); E21B 43/20 (2006.01);
U.S. Cl.
CPC ...
G01N 33/2847 (2013.01); E21B 43/20 (2013.01); G01N 11/02 (2013.01); G01N 13/02 (2013.01); G01N 15/08 (2013.01);
Abstract

A method for measuring liquid-rock and liquid-liquid interfaces including performing at least one measurement technique proximate a subterranean rock sample and an interfacial liquid hydrocarbon fraction, where a liquid hydrocarbon fraction and the subterranean rock sample are combined to exhibit a first interface between the liquid hydrocarbon fraction and the subterranean rock sample, producing the interfacial liquid hydrocarbon fraction. The method includes performing at least one measurement technique proximate the interfacial liquid hydrocarbon fraction and a brine solution, where the liquid hydrocarbon fraction and the brine solution are combined to exhibit a second interface between the liquid hydrocarbon fraction and the brine solution, and where the measurement techniques result in measurements of the interfacial liquid hydrocarbon fraction at macro, micro to nano, nano to sub-nano, and sub-nano scales, and result in measurements of the second interface at macro and micro to nano scales.


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