The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
May. 18, 2016
Yuan Zheng, Shanghai, CN;
Jia Zhu, Shanghai, CN;
Yuan Zheng, Shanghai, CN;
Jia Zhu, Shanghai, CN;
SAINT-GOBAIN GLASS FRANCE, Courbevoie, FR;
Abstract
An optical device and a method for detecting a flaw of a transparent substrate. A first detection unit is configured to detect the substrate at a predetermined low resolution, where the first detection unit includes a first photosensitive element and a first lens between the substrate and the first photosensitive element, and the first photosensitive element and the first lens are disposed such that an object plane is inclined relative to the substrate; a second detection unit configured to detect the substrate at a predetermined high resolution, where the second detection unit includes a second photosensitive element and a second lens between the substrate and the second photosensitive element; and a processor configured to determine a portion of the flaws detected by the first detection unit as flaws to be detected by the second detection unit, and to determine a type of flaw for the substrate imaged.