The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Dec. 17, 2014
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/59 (2006.01); G01N 21/47 (2006.01); G01N 21/64 (2006.01); G02B 21/08 (2006.01); G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/59 (2013.01); G01N 21/47 (2013.01); G01N 21/4795 (2013.01); G01N 21/6458 (2013.01); G02B 21/0028 (2013.01); G02B 21/088 (2013.01); G01N 2021/6491 (2013.01); G01N 2201/0636 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/10 (2013.01);
Abstract
The invention relates to a method for tomographic investigation of a sample, in which method a sample is illuminated with an illuminating light bundle and in which a transmitted light bundle that contains the light of the illuminating light bundle transmitted through the sample is detected with a transmission detector. The invention further relates to an apparatus for tomographic investigation of a sample. Provision is made that the illuminating light bundle and the transmitted light bundle pass in opposite propagation directions through the same objective.