The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Apr. 04, 2016
Applicant:

Elemental Scientific Lasers, Llc, Omaha, NE (US);

Inventors:

Shane Robert Hilliard, Bozeman, MT (US);

Leif Christian Summerfield, Bozeman, MT (US);

Erik Barnholt Larsen, Bozeman, MT (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/04 (2006.01); G01N 35/00 (2006.01); G01N 1/44 (2006.01); H01J 49/04 (2006.01); G01N 30/72 (2006.01); G01N 35/10 (2006.01); G01N 21/71 (2006.01);
U.S. Cl.
CPC ...
G01N 1/04 (2013.01); G01N 1/44 (2013.01); G01N 30/72 (2013.01); G01N 35/1095 (2013.01); H01J 49/0418 (2013.01); G01N 21/714 (2013.01); G01N 2001/045 (2013.01);
Abstract

A sampling apparatus () employs a cell-positioning system to move a sample capture cell () relative to a specimen positioning system (). The cell-positioning system may be controlled to move sample capture cell () opposite to movement of the specimen positioning system () to maintain alignment of the sample capture cell () with an optical path of a laser beam of a sample generator (). Alternatively or additionally, the cell-positioning system may be controlled to move sample capture cell () in response to alignment deviation of a reference beam on a quadrant detector ().


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