The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Oct. 24, 2017
The University of Hong Kong, Hong Kong, CN;
Kenneth Kin Yip Wong, Pokfulam, HK;
Bowen Li, Kennedy Town, HK;
The University of Hong Kong, Hong Kong, CN;
Abstract
The panoramic-reconstruction temporal imaging (PARTI) system is a single-shot optical waveform measurement apparatus that achieves scalable record length and sub-picosecond resolution simultaneously for ultrafast non-repetitive waveform characterization, in analogy with the wisdom of stitching multiple mosaic images to achieve larger-field-of-view in the spatial domain. It consists of a high-fidelity optical buffer, a low-aberration time magnifier and synchronization-control electronics. For specific measurement circumstances, the PARTI system can also be carried out based on a passive optical buffer, which reduces the system complexity. The PARTI system is configured for real-time single-shot characterization of non-repetitive optical dynamic waveform that evolves over a time scale much larger than that of its ultrafast temporal details, i.e., optical dynamics with large time-bandwidth product.