The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Mar. 17, 2016
Nec Corporation, Tokyo, JP;
Takeshi Akagawa, Tokyo, JP;
Masahiro Kubo, Tokyo, JP;
Katsumi Abe, Tokyo, JP;
Kimiyasu Takoh, Tokyo, JP;
Ersin Altintas, Tokyo, JP;
Yuji Ohno, Tokyo, JP;
Tetsuri Ariyama, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
[Object] To obtain interference light having a stronger light intensity, and to more accurately measure a refractive index of a measured object, with a simplified configuration. [Solution Means] A light measurement deviceincludes a phase adjustment unitand a detector. The phase adjustment unitoutputs reference light E(R) based on object light Ebeing light to be obtained by transmission or reflection of light E from a light source with respect to a measured object, and signal light E(S) whose phase is adjusted to be different from a phase of signal light. The detectorderives a transmission or reflection light intensity distribution or a refractive index of the measured object, based on interference light Ebetween signal light E(S) and reference light E(R) to be output by the phase adjustment unit. An optical axis of light E from a light source is linearly disposed. The phase adjustment unitand the detectorare disposed on the optical axis of light E from a light source.