The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Jun. 28, 2017
Applicant:

Horiba, Ltd., Kyoto, JP;

Inventors:

Yuki Itoga, Kyoto, JP;

Jun Tomita, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 25/00 (2006.01);
U.S. Cl.
CPC ...
G01F 25/003 (2013.01); G01F 25/0046 (2013.01);
Abstract

A flowmeter test system that tests a test target flowmeter by flowing fluid through the test target flowmeter and measuring the fluid having flowed through the test target flowmeter by a measurement part different from the test target flowmeter is disclosed. The flowmeter test system includes, a storage part to store the fluid, a distribution flow path to distribute the fluid between the storage part and the test target flowmeter, a measurement part introduction path to be connected to the distribution flow path and introduce the fluid into the measurement part, and a flow path switching part to switch between the distribution flow path and the measurement part introduction path. A pressure loss in a flow path from the flow path switching part to the storage part and a pressure loss in a flow path from the flow path switching part to the measurement part are same.


Find Patent Forward Citations

Itoga, Yuki. (2019). Flowmeter test system and flowmeter test method (U.S. Patent No. 10429231). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10429231

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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