The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
Sep. 21, 2017
Applicant:
Philip M. Johnson, Durham, NH (US);
Inventor:
Philip M. Johnson, Durham, NH (US);
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/00 (2006.01); G01S 17/00 (2006.01); G01C 3/08 (2006.01); G01S 13/06 (2006.01); G01S 17/02 (2006.01); G02B 26/10 (2006.01); G01B 11/00 (2006.01); G01B 11/25 (2006.01); G02B 9/34 (2006.01);
U.S. Cl.
CPC ...
G01C 3/08 (2013.01); G01B 11/005 (2013.01); G01B 11/2513 (2013.01); G01B 11/2545 (2013.01); G01S 13/06 (2013.01); G01S 17/02 (2013.01); G02B 9/34 (2013.01); G02B 26/10 (2013.01);
Abstract
Technologies for determining positional coordinates on the surface of an object are disclosed. In some embodiments the technologies utilize a code drum to encode incident light into structured light and non-structured light that is projected on the surface of the object being measured. The code drum may include a plurality of hybrid cyclic binary code (HCBC) patterns, wherein the plurality of HCBC patterns include a plurality of weighted numbering system patterns, and a plurality of unweighted numbering system patterns. Systems and methods for measuring positional coordinates on a surface of an object being measured are also described.