The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Aug. 29, 2012
Applicants:

Kenichi Nagae, Yokohama, JP;

Hirofumi Taki, Kyoto, JP;

Takuya Sakamoto, Kyoto, JP;

Toru Sato, Kyoto, JP;

Inventors:

Kenichi Nagae, Yokohama, JP;

Hirofumi Taki, Kyoto, JP;

Takuya Sakamoto, Kyoto, JP;

Toru Sato, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 8/5223 (2013.01); G01S 7/52028 (2013.01); G01S 7/52047 (2013.01); G01S 15/8977 (2013.01);
Abstract

A subject information obtaining apparatus includes: a plurality of conversion elements configured to receive an elastic wave and convert the elastic wave into a plurality of received signals, a storage unit configured to store a plurality of reference signals corresponding to shapes of the object inside a subject, and an FDI adaptive processing unit configured to execute the FDI method and the adaptive signal processing using the plurality of received signals and two or more reference signals among the plurality of reference signals, in order to obtain two or more power intensity distributions for the two or more reference signals.


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