The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Jun. 02, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Dong-geon Kong, Hwaseong-si, KR;

Jun-ho Park, Hwaseong-si, KR;

Ji-young Park, Yongin-si, KR;

Hyoung-ki Lee, Seongnam-si, KR;

Ki-wan Choi, Anyang-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/14 (2006.01); A61B 8/08 (2006.01); G01S 7/52 (2006.01); G01S 15/89 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 8/5207 (2013.01); A61B 8/5223 (2013.01); G01S 7/52022 (2013.01); G01S 7/52042 (2013.01); G01S 7/52095 (2013.01); G01S 15/8915 (2013.01); G01S 7/52071 (2013.01);
Abstract

A probe irradiates an ultrasound wave to an object to induce a shear wave and first elasticity information is obtained according to a first calculating scheme. An internal region of interest of the object is set based on shear modulus values included in the first elasticity information. Second elasticity information is obtained based on the shear wave induced to the internal region of interest, according to a second calculating scheme. Accurate elasticity information is acquired by using the first and second elasticity information to obtain third elasticity information from which an elastography image is generated for display to a user.


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