The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2019

Filed:

Sep. 13, 2016
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventor:

Yelei Li, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/021 (2006.01); A61B 5/024 (2006.01); A61B 5/0402 (2006.01); A61B 5/053 (2006.01); A61B 5/08 (2006.01); A61B 5/11 (2006.01); A61B 5/0456 (2006.01); A61B 5/01 (2006.01); A61B 5/0205 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7278 (2013.01); A61B 5/0022 (2013.01); A61B 5/021 (2013.01); A61B 5/02405 (2013.01); A61B 5/02416 (2013.01); A61B 5/0402 (2013.01); A61B 5/0456 (2013.01); A61B 5/0533 (2013.01); A61B 5/0816 (2013.01); A61B 5/1102 (2013.01); A61B 5/4818 (2013.01); A61B 5/681 (2013.01); A61B 5/721 (2013.01); A61B 5/725 (2013.01); A61B 5/7246 (2013.01); A61B 5/7264 (2013.01); A61B 5/7282 (2013.01); A61B 5/742 (2013.01); A61B 5/01 (2013.01); A61B 5/02055 (2013.01); A61B 5/4812 (2013.01); A61B 5/6823 (2013.01); A61B 5/6824 (2013.01); A61B 5/6828 (2013.01); A61B 2562/0219 (2013.01);
Abstract

Provided is an electronic device to monitor a user's biological measurements, where a sensor is configured to acquire a first signal from a user, and a diagnostic processor is configured to pre-process the first signal to generate a second signal, segment the second signal to form signal segments, determine at least one event location for each of the signal segments, match adjacent signal segments for feature alignment, and provide a third signal using results of the feature alignment.


Find Patent Forward Citations

Loading…