The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 01, 2019
Filed:
May. 08, 2014
Applicant:
The Board of Trustees of the Leland Stanford Junior University, Stanford, CA (US);
Inventors:
Manish J. Butte, Stanford, CA (US);
Jayakumar Rajadas, Cupertino, CA (US);
Assignee:
The Board of Trustees of The Leland Stanford Junior University, Stanford, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61M 37/00 (2006.01); A61B 5/01 (2006.01);
U.S. Cl.
CPC ...
A61B 5/685 (2013.01); A61B 5/0077 (2013.01); A61B 5/015 (2013.01); A61B 5/411 (2013.01); A61M 37/0015 (2013.01); A61M 2037/0046 (2013.01); A61M 2037/0053 (2013.01); A61M 2037/0061 (2013.01);
Abstract
A method of testing for specificity and strength of an allergic reaction is performed by penetrating the skin of an individual with the microneedle array comprising a plurality of epitopes and determining the response of the skin to the allergens. The response can be measured with a thermal imaging device. Analysis, and optionally treatment, can be provided to the individual.