The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Dec. 02, 2016
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chung-Lien Ho, Taoyuan, TW;

Ren-Jr Chen, Hsinchu, TW;

Wen-Chiang Chen, Hsinchu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 16/28 (2009.01); H04W 48/16 (2009.01); H04W 74/08 (2009.01); H04L 5/00 (2006.01); H04W 36/00 (2009.01); H04W 72/04 (2009.01); H04W 72/08 (2009.01); H04B 7/06 (2006.01); H04B 7/08 (2006.01); H04W 88/02 (2009.01); H04W 88/08 (2009.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04W 16/28 (2013.01); H04B 7/0695 (2013.01); H04B 7/088 (2013.01); H04L 5/005 (2013.01); H04L 5/0023 (2013.01); H04L 5/0044 (2013.01); H04L 5/0048 (2013.01); H04L 5/0051 (2013.01); H04W 36/0088 (2013.01); H04W 48/16 (2013.01); H04W 72/046 (2013.01); H04W 72/0413 (2013.01); H04W 72/085 (2013.01); H04W 74/0833 (2013.01); H04L 27/2602 (2013.01); H04W 88/02 (2013.01); H04W 88/08 (2013.01);
Abstract

In one of the exemplary embodiments, the disclosure is directed to a post network entry connection method applicable to a user equipment. The method would include not limited to: receiving a time unit which may include a payload region and a downlink header region which may include a first BQMR for a first scan beam and a second BQMR for a second scan beam; obtaining a first reference signal from the first BQMR and a second reference signal from the second BQMR; calculating a first signal quality measurement by using the first reference signal and calculating a second signal quality measurement by using the second reference signal; selecting the first scan beam based on the first signal quality measurement being better than at least the second signal quality measurement; and transmitting the first signal quality measurement which corresponds to the first scan beam via another time unit.


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