The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Dec. 14, 2017
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Hiroki Maruyama, Hino, JP;

Manabu Ichikawa, Hachioji, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/367 (2011.01); H04N 1/409 (2006.01); H04N 5/378 (2011.01); H04N 5/217 (2011.01); H04N 5/232 (2006.01); H04N 5/21 (2006.01);
U.S. Cl.
CPC ...
H04N 5/367 (2013.01); H04N 1/409 (2013.01); H04N 5/217 (2013.01); H04N 5/23203 (2013.01); H04N 5/378 (2013.01); H04N 5/21 (2013.01);
Abstract

An image processing apparatus includes: an acquisition unit configured to acquire defective pixel information including one of positional information on a reading circuit in which defective pixel noise occurs and positional information on each of pixels, blinking defect noise information including one of positional information on a reading circuit in which blinking defect noise occurs and the positional information on each of the pixels, and image data generated by an image sensor; and a noise reduction unit configured to reduce one of the defective pixel noise and the blinking defect noise based on the defective pixel information acquired by the acquisition unit and the blinking defect noise information acquired by the acquisition unit, with respect to the image data acquired by the acquisition unit.


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