The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Jan. 14, 2016
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Hyun-seung Lee, Seoul, KR;

Ji-young Yi, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01); H04N 1/405 (2006.01); H04N 1/52 (2006.01); G06T 5/20 (2006.01); G06T 7/11 (2017.01); G06T 5/00 (2006.01); G06T 5/10 (2006.01);
U.S. Cl.
CPC ...
H04N 1/40075 (2013.01); G06T 5/002 (2013.01); G06T 5/10 (2013.01); G06T 5/20 (2013.01); G06T 7/11 (2017.01); H04N 1/40 (2013.01); H04N 1/405 (2013.01); H04N 1/52 (2013.01); G06T 2207/10008 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20012 (2013.01); G06T 2207/30176 (2013.01);
Abstract

A frequency adaptive descreening method includes obtaining a scan image of an original document, dividing a region of the scan image by analyzing frequency characteristics of the obtained scan image, estimating a resolution with respect to each of regions resulting from dividing the region according to the analyzed frequency characteristics, and adaptively performing filtering on the regions resulting from dividing the region by using the estimated resolution.


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