The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Jun. 05, 2018
Applicant:

Toshiba Tec Kabushiki Kaisha, Shinagawa-ku, Tokyo, JP;

Inventor:

Yasushi Kuribayashi, Mishima Shizuoka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01); H04N 1/12 (2006.01); H04N 1/113 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
H04N 1/1275 (2013.01); G02B 26/10 (2013.01); H04N 1/113 (2013.01);
Abstract

An optical scanning device includes plural sets of optical paths, and in each set of optical paths, first and second light beams emitted from the two light sources having an opening angle in the main scanning direction are orthogonal to a deflection axis of a deflector and are deflected and scanned by the same surface of the deflector at different positions deviating from each other in a deflection axis direction. A first imaging optical element gives positive optical power to the deflected light beams to converge the light beams. A focal position exists between the first imaging optical element and a second imaging optical element arranged on the optical paths in front of first and second surfaces to be scanned on two photoconductive drums. A separation distance exists between the light beams.


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