The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Aug. 17, 2017
Applicant:

Shenzhen China Star Optoelectronics Technology Co., Ltd., Shenzhen, Guangdong, CN;

Inventors:

Aiguo Tu, Guangdong, CN;

Chun-Hsiung Fang, Guangdong, CN;

Tsung-yuan Wu, Guangdong, CN;

Jinchuan Li, Guangdong, CN;

Liang Jiang, Guangdong, CN;

Feng Wei, Guangdong, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/00 (2006.01); G01N 21/95 (2006.01); G01N 21/27 (2006.01); H01L 51/56 (2006.01);
U.S. Cl.
CPC ...
H01L 51/0031 (2013.01); G01N 21/27 (2013.01); G01N 21/95 (2013.01); H01L 51/56 (2013.01); H01L 2251/562 (2013.01);
Abstract

An aging test system and method are disclosed. An aging test system includes a vacuum chamber provided with an aging device for aging a display panel; a lighting mechanism electrically connected to the display panel for lighting up the display panel; at least one spectrometer for detecting a color coordinate and a brightness of the display panel; at least one camera for detecting a dark spot defect of sub-pixels of the display panel. Accordingly, the present invention can save the inspection time, increase the inspection efficiency and save the inspection device in order to reduce the inspection cost.


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