The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
May. 31, 2017
Siemens Healthcare Gmbh, Erlangen, DE;
Rainer Raupach, Heroldsbach, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
A method for determining a spatial distribution of a material property value in an examination region of an examination object is described. With an embodiment of the method, projection scan data is acquired which has been produced with the aid of a single-energy CT scan with a defined X-ray energy spectrum from the examination region of the examination object using a defined scan projection geometry. Furthermore, a target function is established which includes a spectral forward projection of the sought spatial distribution and the acquired projection data. Finally, a spatial distribution of a material property value is determined for which the target function assumes an extremal value. A material property distribution-determining device is also described. A computer tomography system is described, moreover.