The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Oct. 26, 2017
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Takehisa Nishida, Tokyo, JP;
Mariko Okude, Tokyo, JP;
Masayoshi Ishikawa, Tokyo, JP;
Kazuo Muto, Tokyo, JP;
Atsushi Katou, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
An abnormality detection device includes a space recognition success determination unit which determines whether an outside space recognition device is successful in space recognition from information which contains space recognition information and environment information, an environment dependence recognition failure classifying unit which determines and classifies whether a failure of the space recognition corresponds to any one of a failure type previously stored in an environment dependence recognition failure type storage unit with respect to the space recognition information determined as failing in the space recognition, and an abnormality detection unit which uses the space recognition information determined as not corresponding to any failure type by the environment dependence recognition failure classifying unit to detect an abnormality of the outside space recognition device in the space recognition information determined as failing in the space recognition.