The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Mar. 14, 2014
Applicant:
New York University, New York, NY (US);
Inventors:
Jeyavijayan Rajendran, Brooklyn, NY (US);
Ozgur Sinanoglu, Abu Dhabi, AE;
Ramesh Karri, New York, NY (US);
Assignee:
New York University, New York, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 21/75 (2013.01);
U.S. Cl.
CPC ...
G06F 17/5072 (2013.01); G06F 17/5068 (2013.01); G06F 17/5081 (2013.01); G06F 21/75 (2013.01);
Abstract
Exemplary systems, methods and computer-accessible mediums can secure split manufacturing of an integrated circuit by modifying a previous location of at least one pin to a further location of the at least one pin based on a fault analysis procedure. A determination of the further location can include an iterative procedure that can be a greedy iterative procedure. The modification of the location of the at least one partition pin can be performed by swapping at least one further partition pin with the at least one partition pin.