The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Apr. 16, 2019
Applicant:

Capital One Services, Llc, McLean, VA (US);

Inventors:

Vijayalakshmi Natarajan, Glen Allen, VA (US);

Omari Felix, Chesterfield, VA (US);

Assignee:

Capital One Services, LLC, McLean, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 17/27 (2006.01); G06K 9/34 (2006.01); G06F 8/65 (2018.01); G06F 16/215 (2019.01);
U.S. Cl.
CPC ...
G06F 8/65 (2013.01); G06F 16/215 (2019.01); G06F 17/27 (2013.01); G06K 9/344 (2013.01); G06N 20/00 (2019.01); G06K 2209/01 (2013.01);
Abstract

A device receives historical application creation data that includes data associated with creation of a plurality of applications, and processes the historical application creation data, with one or more data processing techniques, to generate processed historical application creation data. The device trains a machine learning model, with the processed historical application creation data, to generate a trained machine learning model, and receives new application data associated with a new application to be created. The device processes the new application data, with the trained machine learning model, to generate one or more predictions associated with the new application, and performs one or more actions based on the one or more predictions associated with the new application.


Find Patent Forward Citations

Natarajan, Vijayalakshmi. (2019). Utilizing a machine learning model to predict metrics for an application development process (U.S. Patent No. 10423403). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10423403

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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