The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Aug. 27, 2014
Applicant:
Hewlett-packard Development Company, L.p., Houston, TX (US);
Inventors:
Wei-Shan Yang, Shanghai, CN;
Irwan Halim, Houston, TX (US);
Assignee:
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/042 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0421 (2013.01); G06F 3/0416 (2013.01); G06F 3/0428 (2013.01); G06F 2203/04109 (2013.01);
Abstract
Examples are directed to detect screen contact using total internal reflection. One example involves detecting contact on a screen, the screen comprising total internal reflection of light; and determining, via at least one processor, a location of the contact on the screen based on a disturbance of the total internal reflection, the disturbance caused by the detected contact.
Yang, Wei-Shan. (2019). Screen contact detection using total internal reflection (U.S. Patent No. 10423281). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10423281
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile