The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Nov. 07, 2014
Applicant:
Schlumberger Technology Corporation, Sugar Land, TX (US);
Inventors:
Tuanfeng Zhang, Lexington, MA (US);
Neil F. Hurley, Boston, MA (US);
Ridvan Akkurt, Lexington, MA (US);
David McCormick, Acton, MA (US);
Shu Zhang, Riverside, CA (US);
Assignee:
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 99/00 (2009.01); G01V 1/40 (2006.01); G01V 5/04 (2006.01); G01V 9/00 (2006.01); E21B 7/04 (2006.01); G01V 1/28 (2006.01); G01V 3/38 (2006.01); G01V 1/42 (2006.01);
U.S. Cl.
CPC ...
G01V 99/005 (2013.01); E21B 7/04 (2013.01); G01V 1/40 (2013.01); G01V 5/04 (2013.01); G01V 9/00 (2013.01); G01V 1/282 (2013.01); G01V 1/42 (2013.01); G01V 3/38 (2013.01); G01V 2210/64 (2013.01);
Abstract
Methods of generating structural models of highly deviated or horizontal wells may be generated from the measurement of true stratigraphic thickness in three dimensions (TST3D). In one aspect, methods may include generating a structural model from one or more deviation surveys of a horizontal well, one or more single channel log measurements, and a three-dimensional reference surface.