The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Jun. 21, 2018
Applicant:

Ihp Gmbh—innovations for High Performance Microelectronics / Leibniz-institut Für Innovative Mikroelektronik, Frankfurt (Oder), DE;

Inventors:

Vladica Sark, Frankfurt (Oder), DE;

Eckhard Grass, Berlin, DE;

Jesus Gutierrez Teran, Frankfurt (Oder), DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); G01S 5/14 (2006.01); G01S 1/04 (2006.01); H04B 1/02 (2006.01); H04L 27/00 (2006.01); G01S 5/02 (2010.01);
U.S. Cl.
CPC ...
G01S 5/14 (2013.01); G01S 1/042 (2013.01); G01S 5/0226 (2013.01); H04B 1/02 (2013.01); H04L 27/00 (2013.01);
Abstract

A method and system for oversampling a waveform with variable oversampling factor is suggested. The method and for dynamic selection of the oversampling factor are based on a modified equivalent time sampling approach. Multiple waveforms are transmitted, which are separated by a variable delay. The method permits that a receiver selects a different oversampling factor for the received waveform. As a result the method and system provide for oversampling a waveform with a variable, dynamically selectable oversampling factor.


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