The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Apr. 20, 2017
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Ian S. Robinson, Redondo Beach, CA (US);

Bradley A. Flanders, Whittier, CA (US);

Daniel Kilfoyle, Falmouth, MA (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 3/46 (2006.01); G01S 3/48 (2006.01); G01S 3/50 (2006.01);
U.S. Cl.
CPC ...
G01S 3/48 (2013.01); G01S 3/46 (2013.01); G01S 3/465 (2013.01); G01S 3/50 (2013.01);
Abstract

Systems and methods for determining an angle of arrival (AoA) of a signal received from an emitters at a pair of antennas spaced apart by more than one half wavelength of the received signal. Features of the signal are determined, including a phase difference between signal components detected at the antennas, and a time difference of arrival (TDOA) having a known measurement error. A set of TDOA possibilities bounded by the known TDOA measurement error and a set of AoA estimates using phase interferometry (PI) within the range are calculated. The TDOA set is iteratively reduced to determine a precise AoA estimate for the emitter.


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