The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Jan. 30, 2017
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Matthias Ruengeler, Markt Schwaben, DE;
Gregor Feldhaus, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method for calibrating a radio frequency test instrument is described wherein a first frequency response is measured using a radio frequency and coarse intermediate frequency grid. A first matrix is created comprising data obtained from said first frequency response measuring. A second frequency response is measured using a radio frequency and fine intermediate frequency grid. A second matrix is created comprising data obtained from said second frequency response measuring. Said first matrix and said second matrix are processed and combined in order to determine a frequency response for a radio frequency desired, said first matrix and said second matrix comprising data obtained from measurements performed with different radio frequency and intermediate frequency grids. Further, a radio frequency test instrument is described.