The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Aug. 31, 2011
Applicants:
Koji Uzawa, Shizuoka, JP;
Emiko Suzuki, Shizuoka, JP;
Kazuyuki Ikeda, Tokyo, JP;
Kazuki Morita, Shizuoka, JP;
Inventors:
Koji Uzawa, Shizuoka, JP;
Emiko Suzuki, Shizuoka, JP;
Kazuyuki Ikeda, Tokyo, JP;
Kazuki Morita, Shizuoka, JP;
Assignee:
KYOWA MEDEX CO., LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/543 (2006.01); G01N 33/538 (2006.01); G01N 33/74 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54333 (2013.01); G01N 33/538 (2013.01); G01N 33/54326 (2013.01); G01N 33/74 (2013.01); G01N 2333/50 (2013.01);
Abstract
A method for measuring fibroblast growth factor-23 (FGF-23) in a sample, which comprise the following steps: The present invention provides a method for measuring FGF-23 in a sample, which have a high sensitivity and have a wide measurement range.