The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Aug. 03, 2017
Ishida Co., Ltd., Kyoto-shi, Kyoto, JP;
Kazuyuki Sugimoto, Ritto, JP;
Kazuhiro Suhara, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes an X-ray irradiation unit that irradiates an article with X-rays, an X-ray detection unit that detects the X-rays transmitted through the article, an inspection unit that generates an X-ray transmission image of the article based on a signal output from the X-ray detection unit and performs inspection of the article based on the X-ray transmission image, and a control unit that controls the X-ray irradiation unit and the X-ray detection unit. The control unit executes a first control of controlling the X-ray irradiation unit such that an irradiation output is increased if a detection output of the X-ray detection unit is decreased when the control unit controls the X-ray irradiation unit such that the irradiation output of the X-ray irradiation unit becomes a first irradiation output. The control unit executes the first control in a state where the article is not irradiated with the X-rays.