The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Nov. 13, 2017
Applicant:

Sakura Finetek U.s.a., Inc., Torrance, CA (US);

Inventors:

Xuan S. Bui, Torrance, CA (US);

Alyicia Marie Rios, Downey, CA (US);

Erico Von Bueren, Rolling Hills Estates, CA (US);

Assignee:

Sakura Finetek U.S.A., Inc., Torrance, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/06 (2006.01); B26D 7/01 (2006.01); B26D 7/27 (2006.01); H05B 33/08 (2006.01); G01N 1/31 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01N 1/06 (2013.01); B26D 7/015 (2013.01); B26D 7/27 (2013.01); H05B 33/0845 (2013.01); G01N 21/255 (2013.01); G01N 2001/061 (2013.01); G01N 2001/065 (2013.01); G01N 2001/066 (2013.01); G01N 2001/068 (2013.01); G01N 2001/315 (2013.01); G01N 2201/0627 (2013.01);
Abstract

A sample sectioning device including a housing having a base member, a cutting mechanism positioned on the base member and operable to cut sections from a sample, a sample holder dimensioned to hold a sample and operable to move with respect to the cutting mechanism during a cutting operation, and a waste removal assembly positioned below the cutting mechanism and the sample holder, the waste removal assembly having a first member and a second member that are dimensioned to remove waste produced during the cutting operation.


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