The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Dec. 14, 2017
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Takahisa Suzuki, Yokohama, JP;

Koichiro Yamashita, Hachioji, JP;

Koji Kurihara, Kawasaki, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/00 (2006.01); H04W 4/38 (2018.01); H04W 4/029 (2018.01); H04B 10/112 (2013.01); H04B 10/114 (2013.01); G01S 5/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/002 (2013.01); G01B 11/02 (2013.01); G01S 5/16 (2013.01); H04B 10/114 (2013.01); H04B 10/1121 (2013.01); H04B 10/1129 (2013.01); H04B 10/1149 (2013.01); H04W 4/029 (2018.02); H04W 4/38 (2018.02);
Abstract

A position measuring apparatus instructs a first node to emit light by transmitting a first light emission pattern to the first node, instructs a second node to emit light by transmitting the first light emission pattern to the second node, when light emission following the instructed first light emission pattern is detected, and instructs the second node to emit light by transmitting a second light emission pattern that is different from the first light emission pattern, when light emission following the instructed first light emission pattern is not detected.


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