The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Dec. 14, 2015
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Toyohiko Yamauchi, Hamamatsu, JP;
Hidenao Yamada, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
An interference observation apparatus includes an interference optical apparatus, a microscope housing, an imaging unit, and an objective lens. The interference optical apparatus includes a housing, a light source, a photodetector, beam splitters, a reference mirror, and a control unit. The interference observation apparatus is configured such that the housing of the interference optical apparatus is disposed between the objective lens attachment portion and the objective lens in a microscope apparatus including the imaging unit for capturing an image of the light passing through the objective lens attached to the objective lens attachment portion having an opening.