The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Oct. 24, 2016
Gsi Helmholtzzentrum Fuer Schwerionenforschung Gmbh, Darmstadt, DE;
Michael Scholz, Erzhausen, DE;
Thilo Elsaesser, Buckenhof, DE;
GSI HELMHOLTZZENTRUM FUER SCHWERIONENFORSCHUNG GMBH, Darmstadt, DE;
Abstract
A method for creating a first data set for modifying an irradiation plan parameter data set used for controlling an irradiation system for irradiating a target volume in an irradiation volume using an ion beam includes defining a sensitive volume within the biological material to be irradiated, determining a fluence distribution of the ion beam, determining a microscopic dose distribution of the ion beam, determining, from the microscopic dose distribution of the ion beam, a spatial microscopic damage distribution of the ion beam, determining an expected value for a number of correlated damage events in a sub-micrometer range in the sensitive volume from the spatial microscopic damage distribution of the ion beam in the sensitive volume, determining the effect of the ion beam on the biological material, and storing data that indicate the effect of the ion beam on the material.