The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Dec. 31, 2015
Shenyang Neusoft Medical Systems Co., Ltd., Liaoning, CN;
Shanshan Lou, Liaoning, CN;
Dan Lv, Liaoning, CN;
Ling Pang, Liaoning, CN;
Changkun Liu, Liaoning, CN;
SHENYANG NEUSOFT MEDICAL SYSTEMS CO., LTD., Shenyang, CN;
Abstract
A method for optimizing CT scanning parameter is disclosed. A target group may be generated from a plurality of reference information samples. Each of the reference information samples may include subject information, information indicating a scanning protocol, one or more scanning parameter values and information indicating reconstructed image quality; the target group can consist of one or more reference information samples with the same subject information and the same scanning protocol. A scanning parameter optimization may be performed according to reconstructed image qualities and scanning parameter values of reference information samples in the target group, so as to acquire a target scanning parameter value of the target group. And according to the target scanning parameter value, a reference X-ray irradiation dose corresponding to the scanning protocol and the subject information of the target group may be determined.