The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 24, 2019
Filed:
Jul. 06, 2016
Carl Zeiss Meditec Ag, Jena, DE;
Manfred Dick, Gefell, DE;
Ferid Bajramovic, Jena, DE;
Wei-Jun Chen, Jena, DE;
Tobias Bühren, Magdala, DE;
Matthias Reich, Jena, DE;
Jörg Meissner, Jena, DE;
Martin Kühner, Bad Klosterlausnitz, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for determining the topography of the cornea of an eye on the basis of an optical, contactless data capture. In the method for determining the topography of the cornea of an eye, which is based on a deflectometric method, the deflectometric measurements are carried out with the aid of a keratometric method by virtue of additional OCT-based scans being made at the keratometric measurement points, wherein the two measurement systems are registered to one another and both the keratometric and the OCT-based measurement values are recorded and used for mutual calibration to determine and output the topographic data. The proposed method serves to determine the topography of the cornea of an eye. It is helpful to ascertain the topography in order to be able to draw conclusions about possible pathological changes. Moreover, the exact measurement of the corneal topography is of great importance for correcting refractive errors.