The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Apr. 26, 2018
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
Xiaoze Ou, Mountain View, CA (US);
Roarke W. Horstmeyer, Palo Alto, CA (US);
Guoan Zheng, Vernon, CT (US);
Changhuei Yang, South Pasadena, CA (US);
Assignee:
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); H04N 5/232 (2006.01); H04N 5/225 (2006.01); H04N 5/32 (2006.01); G02B 21/36 (2006.01); G02B 27/10 (2006.01); G02B 21/08 (2006.01); G02B 21/12 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23232 (2013.01); G02B 21/06 (2013.01); G02B 21/084 (2013.01); G02B 21/086 (2013.01); G02B 21/125 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01); G02B 27/1066 (2013.01); G02B 27/58 (2013.01); H04N 5/2256 (2013.01); H04N 5/32 (2013.01);
Abstract
Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods such as, for example, high NA Fourier ptychographic imaging systems and reflective-mode NA Fourier ptychographic imaging systems.