The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Dec. 28, 2017
Applicant:

Semiconductor Components Industries, Llc, Phoenix, AZ (US);

Inventor:

David Wayne Jasinski, San Jose, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G01C 3/08 (2006.01); H04N 5/369 (2011.01);
U.S. Cl.
CPC ...
H04N 5/23229 (2013.01); G01C 3/08 (2013.01); H04N 5/23212 (2013.01); H04N 5/3696 (2013.01);
Abstract

An imaging system may include an image sensor with phase detection pixel groups for depth sensing or automatic focusing operations. Each phase detection pixel group may have two or more photosensitive regions covered by a single microlens so that each photosensitive region has an asymmetric angular response. The imaging system may use image data from the phase detection pixel group to determine a phase difference. Alternatively, to improve accuracy, the imaging system may obtain two sets of image data using two different aperture sizes. The phase difference associated with each aperture size may be determined. The difference between the two phase differences may be determined and used as a more accurate metric for depth sensing or automatic focusing operations.


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Jasinski, David. (2019). Image sensors with phase detection pixels and a variable aperture (U.S. Patent No. 10419664). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10419664

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