The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Dec. 29, 2015
Applicant:

Oracle International Corporation, Redwood Shores, CA (US);

Inventors:

Nicolas G. Droux, Rio Rancho, NM (US);

Mohan Iyer, Santa Clara, CA (US);

Assignee:

Oracle International Corporation, Redwood Shores, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 43/045 (2013.01); H04L 43/06 (2013.01);
Abstract

A system and method for determining causation of events across nodes. The invention may include receiving a first event report of a first trace. The first event report may include a first trace identifier. The method may also include assembling a first sub-graph using the first event report; receiving a suspend event report including a message identifier and the first trace identifier; receiving a resume event report including the message identifier and a second trace identifier; and receiving a second event report of the second trace, where the second event report includes the second trace identifier. Additionally, the method may include assembling a second sub-graph using the second event report; and assembling, based on matching the message identifier of the suspend event report and the resume event report, a tracing graph using the first sub-graph and the second sub-graph.


Find Patent Forward Citations

Loading…