The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Jun. 27, 2017
The United States of America, As Represented BY the Administrator of the Nasa, Washington, DC (US);
Auburn University, Office of Innovation Advancement and Commercialization, Auburn, AL (US);
Paul M. Danehy, Newport News, VA (US);
Brian S. Thurow, Auburn, AL (US);
UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA, Washington, DC (US);
Abstract
Methods and systems are disclosed for deriving quantitative measurements of an imaged material using plenoptic imaging. In one or more embodiments, image data is generated by a plenoptic camera having a filter configured to transmit a plurality of different spectra in different regions of the filter. A set of plenoptic image data is produced by determining respective sets of pixels in the image data corresponding to the different regions of the filter and determining light intensities of the plurality of different spectra for respective super-pixel groups of the pixels in the image data. One or more additional quantitative measurements of an imaged material are then derived from a comparison of the determined light intensities of two or more of the plurality of different spectra.