The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Mar. 04, 2015
Daihen Corporation, Osaka-shi, Osaka, JP;
Takumi Kobayashi, Osaka, JP;
DAIHEN Corporation, Osaka, JP;
Abstract
An image inspection apparatus is provided with an image sensing unit, a determination unit, and a reference image generation unit. The image sensing unit captures an inspection target. The determination unit takes a difference between a reference image that includes a solid image of the inspection target and a captured image that is captured of the inspection target. The determination unit thereby extracts an image that is not included in an image of the inspection target in the reference image, and determines the quality of the inspection target based on the extracted image. The reference image generation unit generates the reference image that is used by the determination unit by performing predetermined image processing to change to an image showing the inspection target that is included in the captured image into a solid image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile