The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

May. 25, 2016
Applicants:

Jamey Graham, San Jose, CA (US);

Michael Griffin, Redwood City, CA (US);

Tiffany Romain, Oakland, CA (US);

Inventors:

Jamey Graham, San Jose, CA (US);

Michael Griffin, Redwood City, CA (US);

Tiffany Romain, Oakland, CA (US);

Assignee:

Ricoh Co., Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/08 (2012.01); G06Q 30/06 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/0643 (2013.01); G06Q 10/087 (2013.01);
Abstract

The disclosure includes a system and method for comparing a realogram and a planogram to determine differences and generate suggestions, for example, a corrective action, and present the corrective action to a user. An application receives a realogram, the realogram including information about product recognitions, and a planogram corresponding to the realogram. The application aligns the realogram with the planogram using the information about product recognitions. The application retrieves a rule, detects an issue in the realogram based on applying the rule to the realogram aligned with the planogram, generates a corrective action corresponding to the issue in the realogram, and provides the corrective action for display as an overlay on the realogram.


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