The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Aug. 09, 2018
Sas Institute Inc., Cary, NC (US);
SAS INSTITUTE INC., Cary, NC (US);
Abstract
An assessment dataset is selected from an input dataset using a first stratified sampling process based on a value of an event assessment variable. A remainder of the input dataset is allocated to a training/validation dataset that is partitioned into an oversampled training/validation dataset using an oversampling process based on a predefined value of the event assessment variable. A validation sample is selected from the oversampled training/validation dataset using a second stratified sampling process based on the value of the event assessment variable. A training sample is selected from the oversampled training/validation dataset using the second stratified sampling process based on the value of the event assessment variable. The validation sample and the training sample are mutually exclusive. A predictive type model is trained using the selected training sample. A plurality of predictive type models are trained, validated, and scored using the samples to select a best predictive model.