The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Jul. 28, 2014
Applicant:

Snecma, Paris, FR;

Inventors:

Cyril Verbrugge, Moissy-Cramayel, FR;

Jonathan Vlastuin, Moissy-Cramayel, FR;

Clement Dejeu, Moissy-Cramayel, FR;

Anthony Louet, Moissy-Cramayel, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); F01D 5/14 (2006.01); B64C 11/18 (2006.01); F04D 27/00 (2006.01); F04D 29/32 (2006.01); B64D 27/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5095 (2013.01); B64C 11/18 (2013.01); F01D 5/141 (2013.01); F04D 27/001 (2013.01); F04D 29/324 (2013.01); B64D 2027/005 (2013.01); F05D 2220/36 (2013.01); F05D 2260/81 (2013.01); Y02T 50/66 (2013.01); Y02T 50/673 (2013.01);
Abstract

A method for modeling at least a part of a blade of a non-streamlined propeller, part of the blade having an offset. The method includes (a) Parameterization of at least one Bezier curve representing a deformation of the blade characterizing the offset, defined by: a. First and second end control points (PCU1, PCUK); b. At least one intermediate control point (PCUi, i∈[[2,K−1]]) disposed between the end points (PCU1, PCUK). The parameterization being performed according to at least one deformation parameter and the cutting height in the blade, on the basis of which the abscissa of the intermediate control point (PCUi) and the ordinate of the second end point (PCUK) are expressed. Optimized values of the deformation parameter or parameters are determined and then output.


Find Patent Forward Citations

Loading…