The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
May. 05, 2017
Oracle International Corporation, Redwood Shores, CA (US);
Eric S. Chan, Fremont, CA (US);
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
Methods, systems and computer readable medium are provided for sequentially analyzing a series of thread dump samples to estimate the intensity statistic of newly classified stack segments of stack frames. According to one embodiment, a branch point along one or more linearly connected stack frames of a stack segment can be detected, where the stack segment is associated with one or more thread intensity statistic parameters. Upon detecting the branch point along the one or more linearly connected stack frames of the stack segment, the system can split the stack segment into a plurality of new stack segments that each include a subset of the stack frames, where the plurality of new stack segments are referenced by the stack segment. The system can then initialize the one or more thread intensity statistic parameters for each of the new stack segments.