The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Dec. 10, 2015
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Naoya Yoshikawa, Tokyo, JP;
Assignee:
NEC CORPORATION, Minato-Ku, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/20 (2006.01); H04L 12/24 (2006.01); G06F 11/14 (2006.01); H04L 29/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2023 (2013.01); G06F 11/1484 (2013.01); H04L 41/065 (2013.01); H04L 41/0654 (2013.01); H04L 69/40 (2013.01); G06F 2201/805 (2013.01); G06F 2201/815 (2013.01);
Abstract
A fault monitoring device includes a notice reception part configured to receive a notice indicating occurrence of faults from a virtual network device, and a recovery process part configured to carry out a recovery process for one device having the highest priority of fault response among the virtual network device producing the notice, a physical device implementing the virtual network device, and another virtual network device involved in dependency with the virtual network device.
Yoshikawa, Naoya. (2019). Fault monitoring device, virtual network system, and fault monitoring method (U.S. Patent No. 10417101). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10417101
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile