The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Mar. 15, 2017
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Vincent Yin Liu, Chengdu, CN;

Patrick Minggang Lu, Shanghai, CN;

Charlie Chao Chen, Shanghai, CN;

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0793 (2013.01); G06F 11/079 (2013.01); G06F 11/0709 (2013.01); H04L 41/00 (2013.01); H04L 41/069 (2013.01); H04L 41/0636 (2013.01); H04L 41/0681 (2013.01);
Abstract

Embodiments of the present disclosure relate to a method and apparatus for managing a failure of a device. The method comprises detecting whether a failure occurs in a device, and generating a failure report for the failure in response to the failure occurring in the device. The method further comprises querying a device object repository with the failure report, and the object device repository stores historical failure information associated with the device and a fix solution corresponding to the historical failure information. The method further comprises obtaining the fix solution from the device object repository based on a comparison between the failure report and the historical failure information. Embodiments of the present disclosure can manage the failure of the device more effectively.


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